Atomic Force Microscopy (AFM)

The AFM facility features a Bruker Nanoscope MultiMode 8, capable of contact, non-contact, and Bruker’s Peak Force Tapping imaging modes, along with STM imaging. For a full list of capabilities and instrument training, please contact Dr. Jacob Petersen or Dr. William Cross.

AFM can be used to image surface morphology of materials ranging from micron to atomic scales. The combination of probe and samples stage selection can allow for simultaneous 3D topography with spatially resolved mechanical, electrical, magnetic, and other material properties. These capabilities make the AFM a versatile materials characterization instrument that can bridge length scales between SEM and TEM, with the added benefit of surface sensitive measurements.

The AFM facility is used extensively for faculty and graduate and undergraduate research in SDSM&T programs including: Civil and Environmental Engineering, Chemical and Biological Engineering, and Materials and Metallurgical Engineering, Nanoscience and Nanoengineering, and Mechanical Engineering.