Scanning Electron Microscopy (SEM)
The SEM facility features a Zeiss Supra40 variable-pressure field-emission SEM with an Oxford AZtecEnergy advanced system for X-ray microanalysis and electron backscattered diffraction. Additional capabilities include a STEM detector, Peltier-cooled stage (-30°C to +50°C), and a heating stage (+1200°C). Gold sputter coating and carbon evaporation coating are available for sample preparation.
Field-emission SEM is a versatile tool for examining both conductive and nonconductive materials including minerals, metals, ceramics, polymers, biomass, microbes, and various industrial products. Energy-dispersive X-ray microanalysis (EDS or EDX) provides semiquantitative to quantitative analysis for elements boron−uranium. This can be in the form of spot analyses (approximately one micron diameter), line scans, or element maps. Electron backscatter diffraction (EBSD) can be used to map crystallographic orientations and provide statistical data on grain orientation, grain size, and phase composition.
The EMES SEM facility is used in a wide variety of SDSM&T research efforts. These support departmental research in Chemical and Biological Engineering, Geology and Geological Engineering, Nanoscience and Nanoengineering, and Materials and Metallurgical Engineering, as well as research laboratories such as the Additive Manufacturing Laboratory (AML), Arbegast Materials Processing and Joining Laboratory (AMP), Composites and Polymer Engineering Laboratory (CAPE), and Direct Write Laboratory (DWL). It also supports a number of industrial clients, state agencies, and researchers from other universities.